AEP surface metrology systems are used throughout the world to develop new products and to ensure quality of existing products. We help to quantify surface with very high precision. Our 3D surface profilometers (contact and non contact profilers) excel in innovation, ease of use and precision. They generate more than 2 million pixel image with picometer (0.001nm) resolution. In addition, AEP also produces ex-situ and in-situ stress monitors for thin film deposition processes.