Flatness, Bow, Radius of curvature etc. measurement

Surface Flatness, Bow (Radius of Curvature) is a critical design parameter for many industries (optical, semiconductor etc.). AEP profilers with large scanning stage. The high precision optical flat reference ensures superior accuracy in large scale.

All the following products can be used to measure the same.

Contact Profilometer NanoMap-LS
For product information click here.

Optical Profilometer NanoMap-O
For product information click here.

Contact + Optical Profilometer NanoMap-D
For product information click here.

Contact Profilometer NanoMap-LS		Optical Profilometer NanoMap-O		Contact + Optical Profilometer NanoMap-D