NanoMap-O

3D Non Contact Optical
Surface Profilometer

Our high resolution scanning white light Interferometer is one of the
most accurate and easy to use optical metrology system commercially
available.

NanoMap-O series optical profilometer are widely used for
characterizing various surface parameters such as surface roughness, dimension, step height, film thickness etc. All measurements are fast and non contact based.

With combination of high quality laser, lens, low machine noise and
technology it is able to achieve more than 2 MILLION PIXEL images
at 0.001nm resolution.

The post data analysis SPIP software is industry's most versatile and
intuitive. With access to extensive libraries user can do surface
analysis for various applications.