Wear Track, Scratch Depth, Pile up measurement

Several processes require wear track, dig etc measurement for eg. After scratch or tribology test wear volume and wear depth needs to be calculated. AEP profilers— contact and/or optical based profilers can calculate volume wear, depth, pile up etc. with a high degree of repeatability and accuracy.

Following are recommendations for choice of technique

Optical Profilometer NanoMap-O

• Both below mentioned modes present on
  same module as a part of basic package.
• Scanning white light /coarse mode for
  10mm > wear track > 150nm.
• Phase shift/fine mode—wear track < 150nm.

Contact Profilometer NanoMap-LS

• Measures wear track upto 500 microns (0.5mm) with high spatial resolutions.
• More effective than optical profilometer on samples with larger slopes or on material with unknown optical constants. Its also more effective on dirty samples.

Contact + Optical Profilometer NanoMap-D

• Model NanoMap has both Contact and Optical heads on same platform. It can be used to measure wear track of ANY kind sample—thin , thick, dirty, non flat etc. Range nm to 10mm