NanoMap-500LS

3D Contact Surface Profilometer

Our advanced stylus based contact 3D surface profilometer NanoMap-LS is a seamless integration of conventional contact profilometer and scanning probe microscope (SPM) that allows to generate high resolution 2D & 3D images of scanned area (Z range from nm to 1mm)

It generates both detailed 3D and a 2D images upto 150X150mm scanning area. It utilizes superior repeatable, ultra low force that allows it to measure surface topography for any kind of materials.

Widely used for both research and production environment.

The post data analysis SPIP software is industry’s most versatile and intuitive. With access to extensive libraries user can do surface analysis for various applications.

In one way NanoMap-500LS is similar to an AFM but has a much larger scanning area and possesses more versatility.