Surface roughness with sub Angstrom resolution

Surface roughness is a quantitative calculation of the relative roughness of a linear profile or area. Using AEP profilers —
contact and/or optical based techniques it can virtually measure surface roughness of any type of surfaces.

Following are recommendations for choice of technique

Optical Profilometer NanoMap-O

• Both below mentioned modes present on same module
  as a part of basic package.
• Scanning white light /coarse mode for
  50mm > Surface roughness > 150nm.
• Phase shift/fine mode—Surface roughness < 150nm.

Contact Profilometer NanoMap-LS

• Measures surface roughness upto 1mm (1000 microns) with high spatial resolutions.
• More effective than optical profilometer on samples with larger slopes or on material with unknown
  optical constants. Its also more effective on dirty samples (oil film, dirt etc.).

Contact + Optical Profilometer NanoMap-D

• Model NanoMap has both Contact and Optical profilometer on same platform. It can be used to measure surface roughness of ANY kind sample—thin, thick, dirty, non flat etc. Range nm to 50mm.